The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Jul. 17, 2003
Burkhard Groh, Erlangen, DE;
Volker Heer, Gundelsheim, DE;
Mathias Hörnig, Erlangen, DE;
Bernhard Sandkamp, Erlangen, DE;
Burkhard Groh, Erlangen, DE;
Volker Heer, Gundelsheim, DE;
Mathias Hörnig, Erlangen, DE;
Bernhard Sandkamp, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
Method for an x-ray arrangement for compensation of scattered radiation and x-ray apparatus The invention concerns a method for an x-ray arrangement comprising two x-ray systems () for compensation of scattered radiation. In addition, the invention concerns an x-ray apparatus with two x-ray systems () which respectively comprise an x-ray source () and an x-ray detector (). An x-ray scattered radiation image based on the x-ray radiation () scattered on a subject (P) is acquired for at least one of the two x-ray systems (), given a definite positioning of the x-ray systems () relative to one another. The acquired x-ray scattered radiation image is saved and used for subtraction from an x-ray image acquired with the x-ray system () in order to compensate for the influence of the scattered radiation originating from the other x-ray system () and to achieve an improved image quality.