The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Aug. 26, 2002
Jean-claude Kieffer, Montreal Quebec, CA;
Andrzej Krol, Fayetteville, NY (US);
Jean-Claude Kieffer, Montreal Quebec, CA;
Andrzej Krol, Fayetteville, NY (US);
Other;
The State University of New York, Albany, NY (US);
Abstract
The present invention concerns x-ray sources for mammography. A microfocused x-ray source of small size (30 μm and smaller) with x-ray spectrum optimized for enhanced mammography is obtained with a method and system according to the invention. The proposed x-ray source is based on the use of plasmas created by the energy distribution of suprathermal electrons that are produced during the interaction of the laser beam with a solid target. These hot electrons penetrate the surface layer of cold plasma and interact with the solid core of the target. The method and system according to the present invention allows optimizing the x-ray source size, its spectral distribution, and the conversion efficiency in the 17.3-28.5 keV range (adapted to the breast thickness).