The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Jun. 18, 2001
Applicants:

Alan Faichney, Edinburgh, GB;

Keith Watt, Lasswade, GB;

Erik Hupkens, Edinburgh, GB;

Inventors:

Alan Faichney, Edinburgh, GB;

Keith Watt, Lasswade, GB;

Erik Hupkens, Edinburgh, GB;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V001/28 ;
U.S. Cl.
CPC ...
Abstract

A method of analyzing seismic survey data in which a transfer function for a geological model is derived by ray tracing techniques applied to theoretical data and the transfer function is applied to actual survey data in order to calculate reflection points () and/or other attributes for each shot ()/receiver () pair. The number of ray tracing calculations which have to be performed in deriving the model transfer function can thus be controlled. A sufficiently accurate transfer function can be derived using theoretical data representing substantially fewer shot ()/receiver () pairs than are used in the traditional ray tracing solution applied directly to actual survey data. Attribute values for actual source ()/receiver () pairs are estimated by interpolating the transfer function data.


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