The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Feb. 19, 2003
Applicants:

Don Brunnett, Pleasanton, CA (US);

Duc Banh, San Jose, CA (US);

Jingbo Yu, San Jose, CA (US);

Mark Heimbaugh, Pleasanton, CA (US);

Suet Teo, San Jose, CA (US);

Erhard Schreck, San Jose, CA (US);

Inventors:

Don Brunnett, Pleasanton, CA (US);

Duc Banh, San Jose, CA (US);

Jingbo Yu, San Jose, CA (US);

Mark Heimbaugh, Pleasanton, CA (US);

Suet Teo, San Jose, CA (US);

Erhard Schreck, San Jose, CA (US);

Assignee:

Maxtor Corporation, Longmont, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B027/36 ;
U.S. Cl.
CPC ...
Abstract

A PTP test subsystem of a magnetic disk drive identifies an undesired pole tip protrusion (PTP) condition, and takes steps to prevent problems associated with PTP. A PTP stressing mechanism stresses the disk drive during a PTP test mode to induce a PTP condition. A disk contact detection circuit detects when a head of the disk drive contacts the disk. A PTP write current determining circuit is also provided which comprises a write current level detector to ascertain a write current level at which the disk contact detection circuit detects when the head of the disk drive contacts the disk while the disk drive is stressed during the PTP test mode.


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