The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Jan. 17, 2002
Minoru Maeda, Tokyo, JP;
Minoru Maeda, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
A wavelength monitorhaving a Michelson interferometer (or Mach-Zehnder) optical systemof a spatial light type having optical input from a light source has an interference pattern generating meanswhich inclines the wavefronts of interfering beams of collimated light to generate an interference pattern in the light intensity distribution in an interference light beam planes a first slitand a second slitwhich are adjustable in position and provided in front of a first photo-detectorand a second photo-detector, respectively, which receive split beams of interference light, and a signal processing meansby which the changes in the intensity of light from the first photo-detectorand the second photo-detectorare counted and subjected to necessary arithmetic operations to output signals representing wavelength data for the input light.