The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Mar. 19, 2004
Applicant:

Isao Saito, Kanagawa, JP;

Inventor:

Isao Saito, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N000/21 ;
U.S. Cl.
CPC ...
Abstract

It is an object of the present invention to make it possible to use the same inspection apparatus regardless of the difference of the model of the glass sheets. The present invention comprises a step of irradiating a surface of a glass sheet G with light from a patterned light sourcehaving a specific pattern, a step of picking up an image of the glass sheet G, a step of analyzing the image to extract a reflected image of the light source, and a step of performing a good/defective judgment of the shape of the glass sheet G based on the result of comparing data regarding to the extracted reflected image with data regarding to the reflected image by a good product which is registered in advance.


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