The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Jun. 10, 1999
Applicant:
Heine Hansen, Ølstykke, DK;
Inventor:
Heine Hansen, Ølstykke, DK;
Assignee:
Radiometer Medical A/S, Brønshøj, DK;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N033/48 ; G01N021/00 ; G01J003/42 ;
U.S. Cl.
CPC ...
Abstract
The present invention relates to a method in quality control of a spectrophotometer, comprising the steps of determining with the spectrophotomer a spectrum A(λ) of a fluid QC sample containing a dye, and determining a wavelength shift Δλ from C(λ), A(λ), in which C(λ) is a predetermined coefficient vector previously stored in a memory of the spectrophotometer.
Quick Actions:
Hansen, Heine. (2005). Method in quality control of a spectrophotometer (U.S. Patent No. 6980285). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6980285
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile