The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Sep. 25, 2003
Applicants:

Kyoung-hwan Kwon, Seoul, KR;

Hyun-soon Jang, Seoul, KR;

Kyu-hyoun Kim, Suwon, KR;

Inventors:

Kyoung-hwan Kwon, Seoul, KR;

Hyun-soon Jang, Seoul, KR;

Kyu-hyoun Kim, Suwon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B019/00 ;
U.S. Cl.
CPC ...
Abstract

In a frequency multiplier and a method of multiplying a frequency of an external clock signal, a data output buffer, and a semiconductor device including the frequency multiplier and the data output buffer, the frequency multiplier receives an external clock signal having a predetermined frequency and outputs an internal clock signal having greater frequency than the predetermined frequency. In the semiconductor device, the data output buffer outputs data tested in response to test data. Therefore, it is possible to test a plurality of memory cells at a time by using a clock signal having a low frequency. In addition, the time and cost required for the test can be greatly reduced, and conventional testing equipment that operates at a relatively low frequency can be effectively used.


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