The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Mar. 12, 2004
Toru Ochiai, Tokyo, JP;
Shoei Nakamura, Tokyo, JP;
Toru Ochiai, Tokyo, JP;
Shoei Nakamura, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An image can be read during main scanning under an optimized image reading condition even if dust is attached to a document such as a photographic film or the like, or if there are scratches. A scanner irradiates visible light and infrared light from a light source, and an image of the document is separated into infrared and visible components. These components are detected for pixels of the image by an image sensor. A controller, e.g., of the scanner recognizes defective pixels based on the infrared component. Furthermore, the controller corrects a visible component level in the defective pixel based on the infrared component level of the defective pixel and a reference level obtained where there is no defect, in order to create a histogram. The controller determines image reading conditions such as, for example, an exposure amount (exposure time) for use during main scanning and an LUT gradation conversion characteristic based on this histogram.