The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Apr. 10, 2003
Applicants:

Liaohai Chen, Los Alamos, NM (US);

Duncan W. Mcbranch, Santa Fe, NM (US);

Hsing-lin Wang, Los Alamos, NM (US);

David G. Whitten, Santa Fe, NM (US);

Inventors:

Liaohai Chen, Los Alamos, NM (US);

Duncan W. McBranch, Santa Fe, NM (US);

Hsing-Lin Wang, Los Alamos, NM (US);

David G. Whitten, Santa Fe, NM (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q001/68 ;
U.S. Cl.
CPC ...
Abstract

A sensor is provided including a polymer capable of having an alterable measurable property from the group of luminescence and electrical conductivity, the polymer having an intermediate combination of a recognition element, a tethering element and a property-altering element bound thereto and capable of altering the measurable property, the intermediate combination adapted for subsequent separation from the polymer upon exposure to an agent having an affinity for binding to the recognition element whereupon the separation of the intermediate combination from the polymer results in a detectable change in the alterable measurable property, and, detecting said detectable change in the alterable measurable property.


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