The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

Oct. 03, 2001
Applicants:

Christopher A. Atwood, Santa Clara, CA (US);

Yousef R. Yacoub, San Jose, CA (US);

Eric R. Reid, Richland, MI (US);

James C. Liu, Sunnyvale, CA (US);

Angelo Rajadurai, Attleboro, MA (US);

Prashant Srinivasan, Mountain View, CA (US);

Mehdi Ghazizadeh, San Francisco, CA (US);

Inventors:

Christopher A. Atwood, Santa Clara, CA (US);

Yousef R. Yacoub, San Jose, CA (US);

Eric R. Reid, Richland, MI (US);

James C. Liu, Sunnyvale, CA (US);

Angelo Rajadurai, Attleboro, MA (US);

Prashant Srinivasan, Mountain View, CA (US);

Mehdi Ghazizadeh, San Francisco, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F009/44 ;
U.S. Cl.
CPC ...
Abstract

A method of rating a bug, including reporting the bug to a business entity by an interested party, entering information regarding the bug into a database, assigning a priority number for the bug, calculating a sigma number for the bug using the priority number, evaluating the bug to be fixed using the sigma number, and escalating the bug. A bug council rating apparatus, including a database to store the information entered using a graphical user interface, a priority number module configured to generate a priority number, and a sigma number module configured to generate a sigma number.


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