The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

May. 24, 2002
Applicants:

Gayvin E Stong, Fort Collins, CO (US);

Jeffrey Thomas Robertson, Wellington, CO (US);

Inventors:

Gayvin E Stong, Fort Collins, CO (US);

Jeffrey Thomas Robertson, Wellington, CO (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C029/00 ;
U.S. Cl.
CPC ...
Abstract

A memory array test system and method provides for testing a memory array in a manufactured chip. In accordance with one aspect of the invention, a system includes memory test input logic that acquires test data via a data port, a memory test enable logic and a memory test output logic. In accordance with another aspect of the invention, a method acquires test data via a data port, writes the test data to a memory address in the memory array, and reads output data from the memory address in the memory array. Then, the method compares the test data and the output data to determine if the memory address in the memory array passes a test.


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