The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
May. 08, 2003
Applicants:
Yuji Takei, Odawara, JP;
Seiichi Abe, Odawara, JP;
Inventors:
Yuji Takei, Odawara, JP;
Seiichi Abe, Odawara, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B005/00 ;
U.S. Cl.
CPC ...
Abstract
A deskew circuit includes, for clock and every bit of data, a variable delay circuit between a receiver that receives data and a flip-flop that first latches the data, in which a detecting pattern to detect a stable region for receiving data is repeatedly sent before implementing a data transfer, a delay value with which the starting edge and ending edge of the data match the rising edge of the clock is found for the variable delay circuit, and a delay value with which the transfer data can be received in a stable manner is set based on the delay value of the variable delay circuit.