The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

Mar. 02, 2004
Applicant:

Bruce A. Wilson, O'Fallon, MO (US);

Inventor:

Bruce A. Wilson, O'Fallon, MO (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B015/00 ;
U.S. Cl.
CPC ...
Abstract

A computerized method is disclosed for determining the size and location effects of simulated or manufactured features on an object, determining the transformation of a pattern of features, determining usable feature size within a pattern of features, and determining the remaining feature tolerances. The simulated or manufactured position of a pattern of features is used to determine how to translate a tolerance zone framework. Positional errors and remaining feature tolerances are determined relative to the translated design framework.


Find Patent Forward Citations

Wilson, Bruce. (2005). Combined feature dimensional parameter analysis (U.S. Patent No. 6978220). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6978220

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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