The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Oct. 26, 2004
Applicants:
Dean E. Ryan, Dublin, OH (US);
William C. Brodegard, Delaware, OH (US);
Inventors:
Dean E. Ryan, Dublin, OH (US);
William C. Brodegard, Delaware, OH (US);
Assignee:
Ryan International Corporation, Columbus, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08G005/04 ;
U.S. Cl.
CPC ...
Abstract
A critical point on a runway indicates a point at which an aircraft may experience a runway overrun if landing beyond the critical point. A path projection is extended from the aircraft at a descent slope angle to determine whether the aircraft will land beyond the critical point at the current descent slope. Timely alerts may be provided by accounting for the time required to announce a distance value, and the distance traveled during the announcement.