The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

Jul. 01, 2002
Applicants:

Doron Dekel, Toronto, CA;

Claudio Gatti, Toronto, CA;

Inventors:

Doron Dekel, Toronto, CA;

Claudio Gatti, Toronto, CA;

Assignee:

Claron Technology Inc., Toronto, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B005/05 ;
U.S. Cl.
CPC ...
Abstract

A measurement system and method for detecting and tracking the pose of an object displaceable in a coordinate reference frame. In the system and method a visible target pattern is provided on the object. The visible target pattern includes a series of contrast regions for providing at least two feature points. Each of these feature points is located at a juncture of an optically detectable plurality of edges. Each edge in the optically detectable plurality of edges separates different contrast regions. The method and system determine the location of the feature points by first locating the edges using the change in contrast between contrast regions, and then determining junctures of multiple edges. The method and system also involve a stereoscopic digital camera for generating a pair of digital images of the target pattern and a marker template comprising a set of reference characteristics including a relationship between the feature points.


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