The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Dec. 17, 2002
David D Bohn, Ft Collins, CO (US);
Donald R Nohavec, Fort Collins, CO (US);
Barry Eppler, Loveland, CO (US);
David D Bohn, Ft Collins, CO (US);
Donald R Nohavec, Fort Collins, CO (US);
Barry Eppler, Loveland, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An x-ray laminography imaging system and a positioning system to be used therewith. The positioning system is configured to move the object in the X, Y and Z-directions (i.e., pitch and roll) to ensure that the object planes of the object that are being imaged are at least substantially parallel to the focal plane of the imaging system. The object is positioned so that object planes associated with the X, Y and Z-coordinates of points along the contour of the surface of the object are at least substantially parallel to the focal plane of the imaging system during imaging of the object plane. Because some objects, such as printed circuit boards, for example, are sometimes warped, by ensuring that the object plane being imaged is at least substantially parallel to the focal plane of the imaging system, precise laminographs are obtained. The preciseness of the laminographs ensures that the cross-sectional slices of the object are accurate, which improves the robustness of an inspection system that uses x-ray laminography to inspect objects.