The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

Oct. 07, 2003
Applicants:

Jiang Hsieh, Brookfield, WI (US);

Eugene Clifford Williams, Waukesha, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Inventors:

Jiang Hsieh, Brookfield, WI (US);

Eugene Clifford Williams, Waukesha, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B006/03 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides a method for producing images of an object. The method includes dynamically helically scanning an object on a moving table utilizing a scanning imaging system. During the scan, projection views of the object are acquired and stored together with corresponding table locations. A plane for reconstruction of an image of the object is selected. The stored table locations are used to determine geometric variables applicable to the stored projection views; and the stored projection views are filtered and backprojected utilizing the geometrical variables to reconstruct an image of the object at the reconstruction plane.


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