The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Jan. 27, 2004
Applicants:
Johann Engelhardt, Bad Schoenborn, DE;
Werner Knebel, Kronau, DE;
Heinrich Ulrich, Heidelberg, DE;
Inventors:
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B021/00 ;
U.S. Cl.
CPC ...
Abstract
A scanning microscope has a light source that emits illuminating light for illumination of a specimen, at least one first detector for detection of the detected light proceeding from the specimen, an objective arranged in both an illumination beam path and a detection beam path, and a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path. A light-guiding fiber is provided for transporting at least a portion of the detection light from the coupling-out element to the first detector.