The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Jan. 12, 2005
Winfried Denk, Heidelberg, DE;
Michale Sean Fee, New Vernon, NJ (US);
Fritjof Helmchen, Heidelberg, DE;
David William Tank, Princeton, NJ (US);
Winfried Denk, Heidelberg, DE;
Michale Sean Fee, New Vernon, NJ (US);
Fritjof Helmchen, Heidelberg, DE;
David William Tank, Princeton, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A process for operating an optical scanning system includes making an image of a sample by scanning spots in the sample, measuring intensities of light emitted by the scanned spots, determining locations of the scanned spots, and assigning intensities to image pixels based on the measured intensities and determined locations of the scanned spots. In the making of the image, the acts of determining depend on a value of a parameter. The process also includes selecting a new value for the parameter and deciding whether the image of the sample has less double imaging if the new value of the parameter is used during the acts of determining. The process accepts the new value of the parameter in response to determining that the new value produces less of the double imaging.