The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Dec. 26, 2002
Liang-chia Chen, Taipei, TW;
Kuang-chao Fan, Taipei, TW;
Liang-Chia Chen, Taipei, TW;
Kuang-Chao Fan, Taipei, TW;
National Taiwan University, Taipei, TW;
National Taipei University Technology, Taipei, TW;
Abstract
A miniature three-dimensional contour scanner is provided, which integrates the optical element and the set of optical lens of the optical projection module and the image capture module into a miniature measurement device. The device utilizes the optical fiber to guide in the light of outside light source and applies the digital micromirror device (DMD) chip to produce structured light pattern and project it onto the object's surface to be measured. The image sensor element is then used to capture the deformed structured fringe image, and by utilizing this information it is able to obtain the colored two-dimensional image and the three-dimensional contour size of the object. The miniature three-dimensional contour scanner can thus be applied in the measurement of miniature objects in the narrow space.