The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Dec. 04, 2000
Tomonari Morioka, Hitachinaka, JP;
Yasushi Shimizu, Hitachinaka, JP;
Seiichi Ugai, Hitachinaka, JP;
Toshiaki Kita, Hinode, JP;
Kiyoshi Tsukada, Mito, JP;
Tomonari Morioka, Hitachinaka, JP;
Yasushi Shimizu, Hitachinaka, JP;
Seiichi Ugai, Hitachinaka, JP;
Toshiaki Kita, Hinode, JP;
Kiyoshi Tsukada, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A capillary array comprising multiple capillaries and two holding substrates for arranging the aforementioned multiple capillaries in a substantially plane surface by sandwiching at least some of these capillaries mutually. One of the holding substrates has a detection window for transmitting the detected light emitted by a test sample by irradiation of light. Especially, this detection window comprises multiple light transmission areas provided to correspond to each capillary to transmit the detected light, and light cut-off areas provided between these light transmission areas to cut off the detected light. These light cut-off areas cut off light reflected from the surface of capillaries and hence improve the SN ratio, thereby ensuring high-precision detection.