The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

Jun. 14, 2002
Applicants:

Jean Lienard, Igny, FR;

Francisco Sureda, Chatenay Malabry, FR;

Regis Vaillant, Villebon sur Yvette, FR;

Inventors:

Jean Lienard, Igny, FR;

Francisco Sureda, Chatenay Malabry, FR;

Regis Vaillant, Villebon sur Yvette, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D018/00 ;
U.S. Cl.
CPC ...
Abstract

A method and device for calibrating images acquired by radiography comprising an X-ray source, an image acquisition, a support placed between the source and the image acquisition, on which support an object to be X-rayed is intended to be positioned. A region of interest, in which the object is likely to be found, is determined between the support and the image acquisition, the center of gravity of this region is determined and at least one calibration factor of the image or images is determined as a function of the position thus determined.


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