The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Oct. 28, 2003
Neil Colin Widmer, Irvine, CA (US);
Neil Colin Widmer, Irvine, CA (US);
General Electric Company, Shenectady, NY (US);
Abstract
A method and system of obtaining a spatially representative sample of fluid flowing through a duct comprises providing a sample probe having a plurality of inlet ports in the duct, controlling a back pressure within the sample probe so that the back pressure within the sample probe at each inlet port is the same, and receiving a sample portion of the fluid into the plurality of inlet ports. The back pressure may be equal to a static pressure of an outlet portion of the duct. The back pressure may be controlled by venting the sample probe to atmosphere, using a pressure regulator connected to the sample probe or venting to an opening in a wall of an outlet portion of the duct. A cross sectional area of the sample probe may be at least ten times larger than a sum of respective cross sectional areas of the inlet ports.