The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Mar. 31, 2003
Miroslav Petro, Sunnyvale, CA (US);
Adam Safir, Oakland, CA (US);
Ralph B. Nielsen, San Jose, CA (US);
G. Cameron Dales, Palo Alto, CA (US);
Eric D. Carlson, Palo Alto, CA (US);
Thomas S. Lee, Palo Alto, CA (US);
Miroslav Petro, Sunnyvale, CA (US);
Adam Safir, Oakland, CA (US);
Ralph B. Nielsen, San Jose, CA (US);
G. Cameron Dales, Palo Alto, CA (US);
Eric D. Carlson, Palo Alto, CA (US);
Thomas S. Lee, Palo Alto, CA (US);
Symyx Technologies, Inc., Santa Clara, CA (US);
Abstract
Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. The described methods, systems, and devices have primary applications in combinatorial polymer research and in industrial process control.