The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2005
Filed:
Feb. 10, 2003
Yoshiju Watanabe, Ninomiya, JP;
Yoshiju Watanabe, Ninomiya, JP;
Hitachi Global Storage Technologies Japan, Ltd., Odawara, JP;
Abstract
In order to precisely detect latent defects where a data-synchronizing signal is to be stored despite changes in the rotation of an information storage medium, a region data detection is used during a defect detection mode that is longer in the back-and-forth direction than a data-synchronizing signal used during a normal operation mode. The data detection region may be increased by the amount of change in the rotation. Thus, latent defects that may, due to a change in the rotation of the storage medium, come into agreement with the position of a data-synchronizing signal utilized during a normal mode of operation may be reliably detected, maintaining a high precision by taking a change in the rotation of the storage medium into consideration.