The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2005
Filed:
Apr. 15, 2004
Timothy Nephi Tillotson, Heber, UT (US);
Sara Ting, Cupertino, CA (US);
Nathan A. Berg, Fort Collins, CO (US);
Timothy Nephi Tillotson, Heber, UT (US);
Sara Ting, Cupertino, CA (US);
Nathan A. Berg, Fort Collins, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Alteration of a Standard Commands for Programmable Instrumentation (SCPI) command set for instrument control. In representative embodiments, each command of the command set includes a different combination of SCPI grammatical elements; the SCPI grammatical elements are organized hierarchically in a tree data structure; and the tree has nodes with each node comprising one of the SCPI grammatical elements. A node to alter is selected, and an alteration to the selected node is specified. Access to the selected node, as well as to any descendant nodes of the selected node is restricted; the selected node is altered in accordance with the specified alteration, wherein the alteration of the selected node is performed at runtime; and the access restriction to the selected node and to any descendant nodes of the selected node is removed, wherein the access restriction, node alteration, and access removal are performed while the instrument is operational.