The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2005
Filed:
Dec. 04, 2003
Applicants:
Randolph W. Kahn, McKinney, TX (US);
Kenneth G. Vickers, Whitesboro, TX (US);
Richard L. Guldi, Dallas, TX (US);
Edward J. Leonard, Richardson, TX (US);
Yaojian Leng, Dallas, TX (US);
Inventors:
Randolph W. Kahn, McKinney, TX (US);
Kenneth G. Vickers, Whitesboro, TX (US);
Richard L. Guldi, Dallas, TX (US);
Edward J. Leonard, Richardson, TX (US);
Yaojian Leng, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F007/00 ;
U.S. Cl.
CPC ...
Abstract
Wafer order is randomized in-situ by use of a separate wafer staging area and randomly shuffling wafers to and from this staging area to shuffle the processing order of the wafer lot. Positional data is captured for each wafer at both the send and receive ends of the process.