The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2005
Filed:
Sep. 12, 2002
Werner Kluft, 52078 Aachen, DE;
Werner Kluft, 52078 Aachen, DE;
Other;
Abstract
In a monitoring system for the process-accompanying monitoring or detection of collision or overstress situations in machine tools (), comprising a machine control () with one or more sensors () for detecting measured signals or measured signal curves, a monitoring means () in which a comparison of the measured signals or measured signal curves of at least one sensor () with stored monitoring thresholds is performed, and a bidirectional interface () between the monitoring means () and the machine control (), it is provided that the monitoring means (), apart from detecting collision or overstress situations in a machine tool () and transferring machine stop or machine reaction instructions to the machine control (), also permanently stores the measured signals or measured signal curves of the sensors () as measured by the sensors () before, during and after a collision or overstress situation and the data and statuses of the machine control ().