The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2005
Filed:
May. 17, 2002
John Mark Pauly, Redwood City, CA (US);
Juan Manuel Santos, Stanford, CA (US);
Graham Arnold Wright, Toronto, CA;
John Mark Pauly, Redwood City, CA (US);
Juan Manuel Santos, Stanford, CA (US);
Graham Arnold Wright, Toronto, CA;
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A method for reconstructing non-uniformly sampled data to create an image includes: receiving a new partial data set, the new partial data set including a vector of non-uniformly sampled data at k-space positions; subtracting an old partial data set at the same k-space positions from the new partial data set to create a difference vector; gridding the difference vector to create a difference matrix; adding the difference matrix to a frame of previously gridded data to create a new frame; and transforming the new frame to create the image. In one embodiment, gridding includes constructing a gridding table for a data point in a complete data set, and convolving a data point in the difference vector with the gridding table. In another embodiment at least one of a grid size and a first parameter of the window function is optimized using input parameters for at least one of aliasing energy and computation time.