The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2005

Filed:

Nov. 08, 2002
Applicant:

Didier Frot, Choisy le Roi, FR;

Inventor:

Didier Frot, Choisy le Roi, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N021/41 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to a refractometer and to a method of measuring the refractive index of a medium. An incident light ray is directed onto an interface consisting of a medium of known refractive index and of the medium being studied. Then the intensity of the reflected light ray is measured. The incident and reflected light rays are propagated in an optical fiber section. The ratio between the intensity of the incident ray and the intensity of the reflected ray allows the refractive index of the medium studied to be calculated by means of Fresnel's formulas.


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