The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2005

Filed:

Oct. 15, 2004
Applicants:

Hugh S. Wallace, Fort Collins, CO (US);

G. Robert Elsheimer, Fort Collins, CO (US);

Ceceli Ann Wilhelmi, Fort Collins, CO (US);

Inventors:

Hugh S. Wallace, Fort Collins, CO (US);

G. Robert Elsheimer, Fort Collins, CO (US);

Ceceli Ann Wilhelmi, Fort Collins, CO (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03B001/04 ;
U.S. Cl.
CPC ...
Abstract

A method of analysis of a time interval between two selected measurement edges of interest includes locking a plurality of at least three substantially interchangeable oscillators to a common reference frequency, the oscillators containing digital locked-loop (DLL) circuit architecture. The method includes operating one oscillator as a timebase oscillator, and operating the other oscillators as edge-resettable measurement oscillators. The method further includes coupling one oscillator with a switched and physically-immutable parametric variation, producing an offset in the frequency of the coupled oscillator relative to the frequency of the other oscillators. The method includes phase-aligning each of the measurement oscillators to a triggering pulse created by one of selected measurement edges of interest, oscillating each phase-aligned measurement oscillator until its phase matches the phase of the timebase oscillator, and counting the number of oscillation cycles of the phase-aligned measurement oscillator from the time of phase-alignment until the time of phase matching.


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