The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2005

Filed:

Feb. 01, 2002
Applicants:

Mo-ching Justine Lau, Orange, CA (US);

Harrison Doan, Huntington Beach, CA (US);

Raymond Diaz, Irvine, CA (US);

Inventors:

Mo-Ching Justine Lau, Orange, CA (US);

Harrison Doan, Huntington Beach, CA (US);

Raymond Diaz, Irvine, CA (US);

Assignee:

ADC DSL Systems, Inc., Eden Prairie, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F011/00 ;
U.S. Cl.
CPC ...
Abstract

A device apparatus and method are detailed that allow for improved bit error rate (BER) testing, configuration, and operation of a communication device and associated physical communication link, in particular on a HDSL communication device and link. The improved communication device apparatus and method additionally allow for the communication device to utilize an embedded BER tester (BERT) to run commonly utilized BER tests on high speed communication channels (downstream and upstream) associated with the communication device. The device apparatus and method also allow for a BER test to be configured and initiated remotely, with loopback at a remote device and masking of alarm states at the remote device or local device until the BER test is complete.


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