The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2005

Filed:

Oct. 27, 2003
Applicants:

Joachim Eibl, Munich, DE;

Jochen Pliquett, Gaggenau, DE;

Hagen Eckert, Mering, DE;

Inventors:

Joachim Eibl, Munich, DE;

Jochen Pliquett, Gaggenau, DE;

Hagen Eckert, Mering, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F019/00 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to a method and a measuring device for determining a characteristic curve of a high frequency transmitter for transmitting a high frequency signal modulated with a modulation signal. A high frequency signal transmitted by the high frequency transmitter is received by a receiving device () and samples of a complex value, real baseband signal (MEAS) are generated therefrom. By demodulation of the samples of the real baseband signal (MEAS), a modulation symbol sequence (SYM) is obtained, from which an ideal baseband signal (REF) is simulated as reference signal. The real baseband signal (MEAS) is corrected, a corrected, real baseband signal (MEAS') is generated and the deviations of the samples of the corrected, real baseband signal (MEAS′) from the samples of the ideal baseband signal (REF) are evaluated.


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