The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
Dec. 30, 2002
Applicant:
Kuniyasu Haginiwa, Kanagawa, JP;
Inventor:
Kuniyasu Haginiwa, Kanagawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F019/00 ; H05G001/28 ;
U.S. Cl.
CPC ...
Abstract
A method of aligning an object. The method includes the steps of detecting an image of a mark on the object, obtaining a position of the mark based on the detected image, extracting a feature of the mark based on the detected image, and correcting the detected position based on the extracted feature.
Haginiwa, Kuniyasu. (2005). Alignment method and parameter selection method (U.S. Patent No. 6973397). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6973397
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile