The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2005

Filed:

Oct. 10, 2003
Applicants:

Keiji Yamamoto, Ebina, JP;

Ryo Ando, Ebina, JP;

Toshiyuki Kazama, Ebina, JP;

Satoru Torimaru, Ebina, JP;

Takashi Kawabata, Ebina, JP;

Katsunori Kikuchihara, Ebina, JP;

Masaaki Takahashi, Ebina, JP;

Yoko Miyamoto, Ebina, JP;

Satoshi Matsuzaka, Ebina, JP;

Kiyotoshi Kaneyama, Ebina, JP;

Inventors:

Keiji Yamamoto, Ebina, JP;

Ryo Ando, Ebina, JP;

Toshiyuki Kazama, Ebina, JP;

Satoru Torimaru, Ebina, JP;

Takashi Kawabata, Ebina, JP;

Katsunori Kikuchihara, Ebina, JP;

Masaaki Takahashi, Ebina, JP;

Yoko Miyamoto, Ebina, JP;

Satoshi Matsuzaka, Ebina, JP;

Kiyotoshi Kaneyama, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G015/00 ;
U.S. Cl.
CPC ...
Abstract

The present invention enables registration adjustments during actual use of an image forming apparatus. A test pattern is formed on a sheet in a full-color image forming apparatus and the test pattern formed on the sheet is read in an image read unit. From the result of reading the test pattern, misregistrations of vertical and horizontal scaling factors, parallelism, squareness, skew, side registration, and lead registration in the test pattern are determined, and mounting positions, drive timings, drive speeds, and the like of constituent members are adjusted.


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