The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
Nov. 30, 1999
Mikhail Akopyan, Natick, MA (US);
Lowell Jacobson, Grafton, MA (US);
Lei Wang, Shrewsbury, MA (US);
Cognex Technology and Investment Corporation, Mt. View, CA (US);
Abstract
An embodiment of the invention provides a method for training a system to inspect a spatially distorted pattern. A digitized image of an object, including a region of interest, is received. The region of interest is further divided in to a plurality of sub-regions. A size of each of the sub-regions is small enough such that a conventional inspecting method can reliably inspect each of the sub-regions. A search tool and an inspecting tool are trained for a respective model for each of the sub-regions. A search tree is built for determining an order for inspecting the sub-regions. A coarse alignment tool is trained for the region of interest. Another embodiment of the invention provides a method for inspecting a spatially distorted pattern. A coarse alignment tool is run to approximately locate a pattern. Search tree information and an approximate location of a root image, found by the coarse alignment tool, is used to locate sub-regions sequentially in an order according to the search tree information. Each of the sub-regions is inspected, the sub regions being small enough such that a conventional inspecting method can reliably inspect each of the sub-regions.