The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
May. 04, 2000
Vincent K. Jones Iv, Redwood Shores, CA (US);
Derek Gerlach, Mountain View, CA (US);
Gregory Raleigh, Woodside, CA (US);
Vincent K. Jones IV, Redwood Shores, CA (US);
Derek Gerlach, Mountain View, CA (US);
Gregory Raleigh, Woodside, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
Systems and methods for optimally combining signals from multiple antennas to ameliorate the effects of noise and/or interference on OFDM communications are provided. In one embodiment, an initial spatial statistical characterization of interference and/or noise is based on training symbols received via each antenna. Because the transmitted values of the training symbols are already known, there is no need to estimate their transmitted value to form this initial statistical characterization. The data symbol values received via the multiple antennas are combined based on the initial spatial statistical characterization. The result of this combination step is then used to form a refined spatial statistical characterization of noise and/or interference. The received data symbol values are then recombined based on the refined spatial statistical characterization.