The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2005

Filed:

Feb. 19, 2002
Applicants:

Hideaki Maeda, Odawara, JP;

Yoshiju Watanabe, Ninomiya, JP;

Naoki Satoh, Odawara, JP;

Yasuyuki Ito, Chigasaki, JP;

Inventors:

Hideaki Maeda, Odawara, JP;

Yoshiju Watanabe, Ninomiya, JP;

Naoki Satoh, Odawara, JP;

Yasuyuki Ito, Chigasaki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B005/09 ;
U.S. Cl.
CPC ...
Abstract

The present invention enables recovery of data reading, even when thermal asperities or defective media will make it impossible to increase the number of retries or to read the data, occur in the AGC/PLL part. In a device for writing and reading information, when an error occurs in the region of the recording media where the AGC/PLL signal is written, and if that information is written continuously to several sectors, then data reading is performed by using the AGC/PLL of the following sector, without performing a retry, or by performing a minimum number of retries.


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