The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2005

Filed:

Jun. 29, 2000
Applicant:

Yoichi Nakamura, Kanagawa, JP;

Inventor:

Yoichi Nakamura, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N001/04 ;
U.S. Cl.
CPC ...
Abstract

An image reading apparatus in which highly accurate image reading can be carried out by using a line sensor. Light irradiated from a light source is divided into visible light or infrared light by a visible light filter or an infrared light filter, and irradiated onto an image frame of a photographic film. The light transmitted through the image frame is reflected by a mirror and made incident on a linear CCD via a lens unit. At this time, sub-scanning of the image frame is carried out by moving the mirror while the photographic film (i.e., image frame) is stopped, and a frame image is read by the linear CCD. In this way, image reading is carried out by using visible light and infrared light while the image frame is stopped. Accordingly, there is no positional displacement between visible light image data and infrared light image data, and the visible light image data can be corrected with high accuracy based on the infrared light image data.


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