The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
Aug. 29, 2002
Tadashi Kajino, Okazaki, JP;
Tadashi Kajino, Okazaki, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
A lens meter for measuring optical characteristics of a lens, which is capable of measuring a progressive lens easily and an aspherical lens accurately. The lens meter is provided with a lens rest having an aperture, for placing a lens thereon, a measurement optical system having a light source which projects a measurement light bundle onto the lens placed on the lens rest and a photodetector which receives the measurement light bundle transmitted through the lens, for forming a plurality of different measuring positions inside the aperture, calculation means for obtaining optical characteristics at each of the measuring positions based on an output from the photodetector, comparison means for comparing the optical characteristics obtained at the measuring positions, and guiding means for guiding a predetermined one of the measuring positions to at least one of a near viewing section and a far viewing section of a progressive lens based on a result of the comparison.