The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2005

Filed:

Mar. 30, 2001
Applicants:

Konstantine I. Iourcha, San Jose, CA (US);

Roger Swanson, Morgan Hill, CA (US);

Axel Schildan, San Jose, CA (US);

Inventors:

Konstantine I. Iourcha, San Jose, CA (US);

Roger Swanson, Morgan Hill, CA (US);

Axel Schildan, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T015/40 ;
U.S. Cl.
CPC ...
Abstract

A system and method is provided for decreasing the amount of data required to represent depth information for 3D images. In accordance with one embodiment, depth information is represented by a piecewise function Z(x,y). An (x,y) space is split into areas representing a region of primitive shapes. For each of these regions, Z(x,y) is defined as a simple parametric analytical function. Subsequently, only a few parameters are required to encode this function in each region. By using these parametric analytical functions to represent depth value of the split, the present invention achieves advantages such as reductions in required storage space and required bandwidth with a concomitant increase in processing speed.


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