The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
Dec. 22, 2003
Donald W. Sting, New Canaan, CT (US);
Robert V. Burch, Sandy Hook, CT (US);
John A. Reffner, Stamford, CT (US);
Donald K. Wilks, Darien, CT (US);
Donald W. Sting, New Canaan, CT (US);
Robert V. Burch, Sandy Hook, CT (US);
John A. Reffner, Stamford, CT (US);
Donald K. Wilks, Darien, CT (US);
Smiths Detection Inc., Danbury, CT (US);
Abstract
A mid-IR spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes without degrading the microscope's performance. The mid-IR spectrometer attachment, which is mounted to and supported by the visible light microscope, introduces infrared radiation into the optical path of the microscope. Radiation from the mid-IR spectrometer source is directed by a trichroic radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected mid-infrared radiation to the radiation director and then to a mid-infrared radiation detection system. The trichroic radiation director can reflect mid-IR, act as a beam splitter for near-IR and transmit visible light to allow the area of mid-IR spectroscopic analysis to be viewed in either visible light or near-IR.