The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
Oct. 10, 2003
Applicants:
David E. Quinn, Weedsport, NY (US);
Kenneth J. Burdick, Skaneateles, NY (US);
Ray D. Stone, San Diego, CA (US);
John Lane, Weedsport, NY (US);
William N. Cuipylo, Auburn, NY (US);
Inventors:
David E. Quinn, Weedsport, NY (US);
Kenneth J. Burdick, Skaneateles, NY (US);
Ray D. Stone, San Diego, CA (US);
John Lane, Weedsport, NY (US);
William N. Cuipylo, Auburn, NY (US);
Assignee:
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K015/00 ; G01K007/00 ;
U.S. Cl.
CPC ...
Abstract
A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.