The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Jun. 15, 1998
Stephen Richard Hanson, Aldworth, GB;
Edward James Radley, Fleet, GB;
Stephen Richard Hanson, Aldworth, GB;
Edward James Radley, Fleet, GB;
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A test mechanism for testing device driver hardening includes an intercept mechanism for intercepting device driver access calls from a device driver under test and an interface for configuring the intercept mechanism to inject faults according to a determined test pattern. This mechanism enables the arbitrary introduction of typical faults. These faults may be introduced totally asynchronously and so emulate real life. A test harness module can be linked in to a test build of the driver. The test harness can intercept all of the device access calls. It mimics the normal function of these calls accessing the offset address and propagating the appropriate data. A test application is able to interpret a test script and to compare device driver responses to injected faults.