The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Dec. 27, 2002
Craig B. Johnson, Shoreview, MN (US);
Carl R. Crandall, Hugo, MN (US);
Haeng D. Park, St. Paul, MN (US);
Craig B. Johnson, Shoreview, MN (US);
Carl R. Crandall, Hugo, MN (US);
Haeng D. Park, St. Paul, MN (US);
Unisys Corporation, Blue Bell, PA (US);
Abstract
A system and method for testing I/O components without requiring initiation of the test I/O requests from the operating system via the instruction stream. An I/O system facilitates I/O operations between a processing system and I/O devices during normal I/O processing. An exerciser initiation queue is established, which corresponds to an operating initiation queue used during normal I/O processing. The I/O system is configured to monitor for test I/O requests on the exerciser initiation queue in lieu of monitoring for standard I/O requests on the operating initiation queue. A testing module enters the test I/O requests on the exerciser initiation queue in a format analogous to standard I/O requests entered on the operating initiation queue during normal I/O processing. The test I/O requests on the exerciser initiation queue are processed via the I/O system. Upon I/O completion, status may be returned to the testing module for processing of test results.