The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Oct. 25, 2002
Reinier J. Aerdts, Plano, TX (US);
Thomas L. Hill, Dallas, TX (US);
Theodore M. Page, Sterling Heights, MI (US);
William H. Phifer, Downingtown, PA (US);
David J. Schmid, Rochester Hills, MI (US);
Brent L. Blackburn, Allen, TX (US);
Reinier J. Aerdts, Plano, TX (US);
Thomas L. Hill, Dallas, TX (US);
Theodore M. Page, Sterling Heights, MI (US);
William H. Phifer, Downingtown, PA (US);
David J. Schmid, Rochester Hills, MI (US);
Brent L. Blackburn, Allen, TX (US);
Electronic Data Systems Corporation, Plano, TX (US);
Abstract
Techniques are described for determining the complexity of a computing environment. The techniques include developing a model for the complexity of a computing environment based on the quantity of particular elements of the computing environment. The model includes two statistical weights for each element in the complexity model. One statistical weight is applied to each element to provide a complexity rating of the element. Another statistical weight is applied to each element to provide a complexity rating across all elements.