The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Feb. 01, 2002
Kim Ippolito, Pittsburgh, PA (US);
Oleg Lapets, Allison Park, PA (US);
Michael Sipe, Pittsburgh, PA (US);
Randall Shopoff, Pittsburgh, PA (US);
Kim Ippolito, Pittsburgh, PA (US);
Oleg Lapets, Allison Park, PA (US);
Michael Sipe, Pittsburgh, PA (US);
Randall Shopoff, Pittsburgh, PA (US);
Cellomics, Inc., Pittsburgh, PA (US);
Abstract
The invention provides a method for a method for determining a best initial focal position estimate for a current sample location on a substrate comprising multiple sample locations, comprising determining the best initial focal position estimate by using a result from one or more techniques selected from the group consisting of linear regression analysis of focal positions determined for at least two other sample locations on the substrate and quadratic regression analysis of focal positions determined for at least three other sample locations on the substrate.