The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Nov. 30, 2000
Paul Hartmann, Weiz, AT;
Paul Hartmann, Weiz, AT;
Perimed AB, Järfälla, SE;
Abstract
A system and method for determining the local distribution of measurement variables being measured relative to or present in a predefined measurement area of a biological sample wherein in a first optical measuring process the local distribution of a first of the measurement variables is determined using a sensor film applied to the measurement area and including a luminescence indicator reacting to the first measurement variable by a change of luminescence decay time. The luminescence decay time or a quantity derived therefrom is recorded by an imaging technique as a function of the first measurement variable. In a second optical measuring process the local distribution of a second of the measurement variables is determined simultaneously or immediately following, using an imaging technique which is effective through the sensor film of the first optical measuring process.