The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2005

Filed:

Jan. 16, 2002
Applicants:

Yongchun Lee, Rochester, NY (US);

George O. Simmons, North Greece, NY (US);

Inventors:

Yongchun Lee, Rochester, NY (US);

George O. Simmons, North Greece, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/38 ;
U.S. Cl.
CPC ...
Abstract

A process and system for automating the image quality inspection and correction for scanned document which previously required a human operator. For every scanned and thresholded image, the process and system performs an automatic evaluation through a binary image quality detection system which generates an image noise index indicative of the amount of image artifacts or image loss. When a poor quality scanned page is detected, for example, too much speckle noise, the gray scale image is retrieved or the image is rescanned. The gray scale image then automatically undergoes an image quality correction process to produce a clean, readable binary image.


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